SCT New customer orders Aehr FOX-NP multi-wafer test and burn-in system for silicon carbide MOSFETs

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SCT New customer orders Aehr FOX-NP multi-wafer test and burn-in system for silicon carbide MOSFETs

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Semiconductor production test, burn-in and reliability qualification equipment supplier Aehr Test Systems of Fremont, CA, USA has received an initial customer order for a FOX-NP wafer-level test & burn-in system, multiple WaferPak Contactors, and a FOX WaferPak Aligner to be used for engineering, qualification and small-lot production wafer-level test & burn-in of silicon carbide devices...

Source: https://www.semiconductor-today.com/new ... 0923.shtml
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