Fig. 1: Cross-section showing nanosheets stacked as in a GAA transistor. You can see the gate’s stronger grip in a steeper sub-threshold slope (SS), which translates to a higher Ion/Ioff ratio (a transistor, as a switch, will carry the current Ion in its “on” state and the current Ioff, when in the “off” state). GAA offers better electrostatic control and hence the steeper SS. Another advantage of GAA is that the channel thickness is better controlled in the manufacturing process, leading to smaller device variations. GAA can also be thought of as fins flipped sideways and then stacked vertically. That makes the width continuous in the plane of the layout [3], allowing the process to be optimized using the nanosheet width as a variable. In effect, nanosheet width becomes a knob designers can turn to balance performance against area (Figure 2). Wide transistors help achieve high performance in a standard cell owing to higher current carrying capability, which makes high-performance standard cells ideal for high-performance computing. Conversely, narrow transistor width can be used for high-density, low-power standard cells, which are better suited to battery-powered mobile applications [3]. It’s worth noting that planar, FinFET, and GAA devices are each likely to keep playing a role: not every system-on-chip (SoC) function needs to be implemented in the most advanced node, and heterogeneous, multi‑die designs increasingly bring these transistor types together in a single product.
Fig. 2: Standard cell representational top view (not to scale). GAA allows flexible transistor width. Why GAA is critical in the AI era An important implication of transistor scaling is that each subsequent node consumes less power than its predecessors. Right now, the semiconductor industry’s growth is fueled by the artificial intelligence (AI) “revolution”. With the introduction of large language models to a broader audience in 2022, the user base of AI tools has grown exponentially. Training such models requires a huge amount of computation, which, in turn, needs specialized hardware such as GPUs, often sitting in large data centers. It is predicted that, at the current rate of growth, data centers will consume ~7-8% of global electricity demand sometime around 2030 (Figure 3) [3, 4]. That kind of power draw puts real pressure on the global electricity infrastructure, and it’s a big reason the industry is so focused on designing chips that consume less power. This makes GAA (and its successor transistor geometries) particularly important in the AI era. Today, high‑performance mobile is leading GAA adoption, with hyperscale servers and high‑performance CPUs following closely behind—a clear shift from the early‑adoption picture of just two years ago.
Fig. 3: Current and future forecasts on global electricity demand due to data centers [3]. Two enablers: Backside power and DTCO Two architectural shifts are enabling GAA’s full potential at advanced nodes: - Backside power delivery: Traditionally, the transistors are built first, then many layers of metal are stacked on top to route power and signals between them. As dimensions shrank, routing became harder, with signal and power competing for space. In recent years, foundries have begun separating power and signal delivery to the transistor from two opposite sides of the transistor layer. This frees up more space for both and makes routing easier. With backside power delivery, bulk silicon no longer sitting beneath the transistors to carry heat away, so self-heating becomes a challenge to manage.
- Design technology co-optimization (DTCO): Standard cells and static random-access memories (SRAMs) take up most of the area inside a SoC [5], so they largely determine its power, performance, and area (PPA). Beyond reducing the dimensions that impact cell area—such as contacted poly pitch (CPP), gate length, and metal pitch—advanced nodes require optimizing many other aspects to achieve desired PPA, including co-optimization with advanced EDA tools [5]. A technology can be optimized for PPA at multiple levels: gate length, poly pitch, and metal pitch at the first level; then gate cross-coupled structures and diffusion breaks; then optimizing for place-and-route access for the pins; and ultimately, at the block level [5].
Fig. 4: 3D image showing NMOS and PMOS stacked vertically in a CFET-like arrangement. Recently, researchers demonstrated working ring oscillators and SRAM cells built with CFETs [6]. As with GAA technology, DTCO will be an important part of PPA optimization for CFETs [6]. Recent work demonstrated 3.5-track CFET designs in A7 (7 Å technology equivalent) reaching 46% area reduction compared to their N2 (2nm technology equivalent) reference, while keeping performance the same [7]. Potentially combined with backside power delivery and with the growing role of multi‑die, chiplet‑based design, CFET is poised to be the next step in extending scaling into the angstrom era. For more information, visit: Synopsys Foundation IP References - R. Schaller, “Moore’s law: past, present and future,” IEEE Spectrum, vol 34, no.6, pp. 52-59, 1997.
- Hisamoto et al., “FinFET—a self-aligned double-gate MOSFET scalable to 20 nm,” IEEE Transactions on Electron Devices, vol. 47, no. 12, pp. 2320–2325, Dec. 2000, doi: 10.1109/16.887014, 2000.
- Kwon et al., “Gate-All-Around Technology for Sustainable AI: A Foundation for Future Logic Architectures,” in 2025 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA, pp. 1-4, 2025.
- IEA, Electricity 2024: Analysis and Forecast to 2026, Paris, France: International Energy Agency, 2024.
- Song et al., “3nm gate-all-around (GAA) design-technology co-optimization (DTCO) for succeeding PPA by technology,” in 2022 IEEE Custom Integrated Circuits Conference (CICC), 2022.
- Liao et al., “First demonstration of CFET ring oscillator and SRAM bit-cell functionality at gate pitch smaller than 48 nm for future logic and SRAM technology,” in2025 IEEE International Electron Devices Meeting (IEDM), 2025.
- Y. Lin et al., “3.5 T CFET Block-Level DTCO for Superior PPA in A7 Node by Split Power, hDR Cells, Optimized Pins and BEOL,” in 2025 IEEE International Electron Devices Meeting (IEDM), 2025.
Source: https://semiengineering.com/from-gaa-to ... he-ai-era/