SCT Keysight introduces new method to accelerate power amplifier digital pre-distortion test speeds

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SCT Keysight introduces new method to accelerate power amplifier digital pre-distortion test speeds

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Keysight Technologies Inc of Santa Rosa, CA, USA has introduced the new Iterative Learning Control (ILC) test method that significantly shortens digital pre-distortion (DPD) test times for power amplifiers...

Source: https://www.semiconductor-today.com/new ... 0323.shtml
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