SCT Covalent expands wafer-level characterization through Oxford Instruments collaboration

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SCT Covalent expands wafer-level characterization through Oxford Instruments collaboration

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Covalent Corp of Sunnyvale, CA, USA has announced a strategic collaboration with UK-based Oxford Instruments that expands its semiconductor characterization offering with customer-ready, wafer-level Raman and photoluminescence (PL) workflows. The capability is now available to customers tackling defectivity, stress and strain mapping, process development, and failure analysis at full-wafer scale...

Source: https://www.semiconductor-today.com/new ... 0626.shtml
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