SCT JEDEC publishes guidelines for reverse-bias reliability evaluation of GaN power conversion devices

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SCT JEDEC publishes guidelines for reverse-bias reliability evaluation of GaN power conversion devices

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The JEDEC Solid State Technology Association (which develops standards for the microelectronics industry) has published ‘JEP198: Guideline for Reverse Bias Reliability Evaluation Procedures for Gallium Nitride Power Conversion Devices’. Developed by the JC-70.1 Gallium Nitride Subcommittee of JEDEC’s JC-70 Wide Bandgap Power Conversion Semiconductor Committee (which was formed in October 2017 with 23 member companies, rising to over 80 now), JEP198 is available for free download from the JEDEC website...

Source: https://www.semiconductor-today.com/new ... 0124.shtml
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